Repulsive Force for Micro- and Nano-Non-Contact Manipulation

Non-contact positioning of micro-objects using electric fields has been widely explored, based on several physical principles such as electrophoresis, dielectrophoresis (DEP) or optical dielectrophoresis (ODEP), in which the actuation force is induced by an electric charge or an electric dipole placed in an electric field. In this paper, we introduce a new way to control charges in non-contact positioning of micro-objects using chemical functionalization (3-aminopropyl) triethoxysilane—APTES) able to localize charges on a substrate and/or on a micro-object. We demonstrate that this functionalization in a liquid with a low ionic strength is able to concentrate a significant amount of electric charges on surfaces generating an electric field over a long distance (about 10 microns), also called a large exclusion zone (EZ). A model is proposed and validated with electrostatic force measurements between substrate and microparticles (diameter up to 40 µm). We demonstrate that the magnitude of the force and the force range decrease rapidly when the ionic strength of the medium increases. Based on the proposed model, we show that this new way to localize charges on micro-objects may be used for non-contact positioning.


Repulsive Force for Micro- and Nano-Non-Contact Manipulation
Type de publication
Article de revue
Année de publication
Applied Sciences
Date de publication
Soumis le 20 mars 2023